Kk 8 < 20190614154424-239007 > pub
- technique: XRF_procedure of Kushiro (1994)
- device: XRF Philips PW-1480 (Tokyo)
- operator: Kuritani
- modified at 2019-06-14
- stone: Kk 8
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 57.72 | % | |||
| [TiO2] | 1.09 | % | |||
| [Al2O3] | 17.58 | % | |||
| [Fe2O3T] | 7.04 | % | |||
| [MnO] | 0.15 | % | |||
| [MgO] | 2.39 | % | |||
| [CaO] | 5.46 | % | |||
| [Na2O] | 5.34 | % | |||
| [K2O] | 1.28 | % | |||
| [P2O5] | 0.47 | % | |||
| total | 98.51 | % | |||
| [Ba] | 249.0 | ppm | |||
| [Cr] | 5.0 | ppm | |||
| [Nb] | 7.5 | ppm | |||
| [Ni] | 0.5 | ppm | |||
| [Pb] | 4.2 | ppm | |||
| [Rb] | 30.0 | ppm | |||
| [Sr] | 450.0 | ppm | |||
| [Th] | 4.8 | ppm | |||
| [Y] | 25.9 | ppm | |||
| [Zr] | 301.0 | ppm | |||