80801-4 < 20190513160241-230987 > pub
- technique: XRF_procedure of Norrish and Chappell (1977)
- device: XRF PANalytical PW2400
- operator: Nakamura
- modified at 2019-05-14
- stone: 80801-4
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 48.45 | % | |||
| [TiO2] | 1.94 | % | |||
| [Al2O3] | 15.89 | % | |||
| [MnO] | 0.15 | % | |||
| [MgO] | 6.99 | % | |||
| [CaO] | 8.78 | % | |||
| [K2O] | 1.78 | % | |||
| [P2O5] | 0.53 | % | |||
| total | 98.88 | % | |||
| [Y] | 23.0 | ppm | |||
| [Rb] | 41.0 | ppm | |||
| [Sr] | 570.0 | ppm | |||
| [Zr] | 170.0 | ppm | |||
| [Cr] | 300.0 | ppm | |||
| [Ni] | 160.0 | ppm | |||
| [Fe2O3T] | 11.08 | % | |||