80903-3 < 20190514150548-689944 > pub
- technique: XRF_procedure of Norrish and Chappell (1977)
- device: XRF PANalytical PW2400
- operator: Nakamura
- modified at 2019-05-14
- stone: 80903-3
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 47.99 | % | |||
| [TiO2] | 2.42 | % | |||
| [Al2O3] | 16.1 | % | |||
| [Fe2O3T] | 12.09 | % | |||
| [MnO] | 0.16 | % | |||
| [MgO] | 6.9 | % | |||
| [CaO] | 8.82 | % | |||
| [K2O] | 1.51 | % | |||
| [P2O5] | 0.53 | % | |||
| [Y] | 25.2 | ppm | |||
| [Rb] | 22.3 | ppm | |||
| [Sr] | 620.0 | ppm | |||
| [Cr] | 170.0 | ppm | |||
| [Ni] | 62.8 | ppm | |||