80916-1 < 20190514150549-560864 > pub
- technique: XRF_procedure of Norrish and Chappell (1977)
- device: XRF PANalytical PW2400
- operator: Nakamura
- modified at 2019-05-14
- stone: 80916-1
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 48.43 | % | |||
| [TiO2] | 1.33 | % | |||
| [Al2O3] | 14.07 | % | |||
| [Fe2O3T] | 10.31 | % | |||
| [MnO] | 0.14 | % | |||
| [MgO] | 8.29 | % | |||
| [CaO] | 8.88 | % | |||
| [K2O] | 1.47 | % | |||
| [P2O5] | 0.41 | % | |||
| [Y] | 20.0 | ppm | |||
| [Rb] | 34.5 | ppm | |||
| [Sr] | 540.0 | ppm | |||
| [Cr] | 380.0 | ppm | |||
| [Ni] | 244.0 | ppm | |||