C20 < 20190522153218-944556 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Yokoyama
- modified at 2019-05-22
- stone: C20
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 46.5 | % | |||
| [TiO2] | 3.27 | % | |||
| [Al2O3] | 16.0 | % | |||
| [MnO] | 0.2 | % | |||
| [MgO] | 5.39 | % | |||
| [CaO] | 10.0 | % | |||
| [Na2O] | 4.49 | % | |||
| [K2O] | 1.84 | % | |||
| [P2O5] | 0.86 | % | |||
| [LOI] | -0.32 | % | |||
| total | 100.0 | % | |||
| [Cr2O3] | 79.0 | ppm | |||
| [NiO] | 46.0 | ppm | |||