C20 < 20190522153218-944556 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Yokoyama
  • modified at 2019-05-22
  • stone: C20
measured value uncertainty unit description
[SiO2] 46.5 %
[TiO2] 3.27 %
[Al2O3] 16.0 %
[MnO] 0.2 %
[MgO] 5.39 %
[CaO] 10.0 %
[Na2O] 4.49 %
[K2O] 1.84 %
[P2O5] 0.86 %
[LOI] -0.32 %
total 100.0 %
[Cr2O3] 79.0 ppm
[NiO] 46.0 ppm
name global-id
name spots global-id