Ta-26 < 20190613153949-950172 > pub
  • technique: XRF_procedure of Kushiro (1994)
  • device: XRF Philips PW-1480 (Tokyo)
  • operator: Kuritani
  • modified at 2019-06-13
  • stone: Ta-26
measured value uncertainty unit description
[SiO2] 51.2 %
[TiO2] 1.31 %
[Al2O3] 17.97 %
[Fe2O3T] 8.25 %
[MnO] 0.14 %
[MgO] 5.44 %
[CaO] 9.6 %
[Na2O] 4.2 %
[K2O] 0.57 %
[P2O5] 0.27 %
total 98.96 %
[Ba] 121.0 ppm
[Cr] 139.8 ppm
[Nb] 3.27 ppm
[Ni] 47.5 ppm
[Pb] 3.33 ppm
[Rb] 12.8 ppm
[Sr] 428.0 ppm
[Th] 2.97 ppm
[Y] 23.0 ppm
[Zr] 181.7 ppm
name global-id
name spots global-id