Kr 72 < 20190614154428-498432 > pub
  • technique: XRF_procedure of Kushiro (1994)
  • device: XRF Philips PW-1480 (Tokyo)
  • operator: Kuritani
  • modified at 2019-06-14
  • stone: Kr 72
measured value uncertainty unit description
[SiO2] 60.23 %
[TiO2] 0.79 %
[Al2O3] 17.6 %
[Fe2O3T] 5.6 %
[MnO] 0.14 %
[MgO] 1.65 %
[CaO] 4.57 %
[Na2O] 5.49 %
[K2O] 1.49 %
[P2O5] 0.41 %
total 97.96 %
[Ba] 266.0 ppm
[Cr] 0.0 ppm
[Nb] 8.2 ppm
[Ni] 0.0 ppm
[Pb] 5.4 ppm
[Rb] 36.2 ppm
[Sr] 442.0 ppm
[Th] 5.3 ppm
[Y] 24.3 ppm
[Zr] 338.0 ppm
name global-id
name spots global-id