Kr 72 < 20190619143326-864510 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-20
  • stone: Kr 72
measured value uncertainty unit description
[SiO2] 62.57 %
[TiO2] 0.72 %
[Al2O3] 17.46 %
[Fe2O3] 1.63 %
[MnO] 0.14 %
[MgO] 1.68 %
[CaO] 4.47 %
[Na2O] 5.7 %
[K2O] 1.55 %
[P2O5] 0.39 %
total 100.21 %
[Cr] 0.0 ppm
[Ni] 0.0 ppm
[Fe2O3T] 5.4 %
[LOI] 0.15 %
name global-id
name spots global-id