Ta-2_2006 < 20190620142428-403283 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-20
  • stone: Ta-2
measured value uncertainty unit description
[SiO2] 59.2 %
[TiO2] 1.05 %
[Al2O3] 17.51 %
[Fe2O3] 2.57 %
[MnO] 0.15 %
[MgO] 2.38 %
[CaO] 5.48 %
[Na2O] 5.41 %
[K2O] 1.28 %
[P2O5] 0.49 %
total 100.2 %
[Cr] 0.0 ppm
[Ni] 1.0 ppm
name global-id
name spots global-id