Ta-2_2006 < 20190620142428-403283 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Kuritani
- modified at 2019-06-20
- stone: Ta-2
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 59.2 | % | |||
| [TiO2] | 1.05 | % | |||
| [Al2O3] | 17.51 | % | |||
| [Fe2O3] | 2.57 | % | |||
| [MnO] | 0.15 | % | |||
| [MgO] | 2.38 | % | |||
| [CaO] | 5.48 | % | |||
| [Na2O] | 5.41 | % | |||
| [K2O] | 1.28 | % | |||
| [P2O5] | 0.49 | % | |||
| total | 100.2 | % | |||
| [Cr] | 0.0 | ppm | |||
| [Ni] | 1.0 | ppm | |||