Nm 20 < 20190621120926-672177 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-21
  • stone: Nm 20
measured value uncertainty unit description
[SiO2] 48.78 %
[TiO2] 1.33 %
[Al2O3] 17.37 %
[Fe2O3T] 10.87 %
[MnO] 0.18 %
[MgO] 8.05 %
[CaO] 9.46 %
[Na2O] 3.36 %
[K2O] 0.65 %
[P2O5] 0.27 %
[LOI] -0.04 %
total 100.27 %
[Cr] 260.0 ppm
[Ni] 133.0 ppm
name global-id
name spots global-id