Sn 14 < 20190621120927-211265 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-21
  • stone: Sn 14
measured value uncertainty unit description
[SiO2] 48.79 %
[TiO2] 1.36 %
[Al2O3] 17.16 %
[Fe2O3T] 10.66 %
[MnO] 0.17 %
[MgO] 7.84 %
[CaO] 9.35 %
[Na2O] 3.57 %
[K2O] 0.78 %
[P2O5] 0.29 %
[LOI] -0.17 %
total 99.8 %
[Cr] 235.0 ppm
[Ni] 124.0 ppm
name global-id
name spots global-id