Sn 22 < 20190621120928-546649 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-21
  • stone: Sn 22
measured value uncertainty unit description
[SiO2] 48.86 %
[TiO2] 1.32 %
[Al2O3] 17.2 %
[Fe2O3T] 10.84 %
[MnO] 0.17 %
[MgO] 8.0 %
[CaO] 9.6 %
[Na2O] 3.48 %
[K2O] 0.67 %
[P2O5] 0.31 %
[LOI] -0.16 %
total 100.3 %
[Cr] 254.0 ppm
[Ni] 132.0 ppm
name global-id
name spots global-id