Sn 25 < 20190621120928-567245 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-21
  • stone: Sn 25
measured value uncertainty unit description
[SiO2] 49.1 %
[TiO2] 1.38 %
[Al2O3] 17.29 %
[Fe2O3T] 10.62 %
[MnO] 0.17 %
[MgO] 7.49 %
[CaO] 9.2 %
[Na2O] 3.71 %
[K2O] 0.79 %
[P2O5] 0.32 %
[LOI] -0.22 %
total 99.84 %
[Cr] 233.0 ppm
[Ni] 126.0 ppm
name global-id
name spots global-id