Nm 1 < 20190621120928-059769 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-21
  • stone: Nm 1
measured value uncertainty unit description
[SiO2] 49.2 %
[TiO2] 1.15 %
[Al2O3] 16.99 %
[Fe2O3T] 10.86 %
[MnO] 0.18 %
[MgO] 8.34 %
[CaO] 9.89 %
[Na2O] 3.24 %
[K2O] 0.72 %
[P2O5] 0.24 %
[LOI] -0.32 %
total 100.49 %
[Cr] 302.0 ppm
[Ni] 141.0 ppm
name global-id
name spots global-id