Sn 1 < 20190621120931-725793 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Kuritani
- modified at 2019-06-21
- stone: Sn 1
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 48.97 | % | |||
| [TiO2] | 1.07 | % | |||
| [Al2O3] | 16.95 | % | |||
| [Fe2O3T] | 10.79 | % | |||
| [MnO] | 0.18 | % | |||
| [MgO] | 8.48 | % | |||
| [CaO] | 9.4 | % | |||
| [Na2O] | 3.18 | % | |||
| [K2O] | 0.72 | % | |||
| [P2O5] | 0.26 | % | |||
| [LOI] | 0.25 | % | |||
| total | 100.24 | % | |||
| [Cr] | 292.0 | ppm | |||
| [Ni] | 158.0 | ppm | |||