Sn 2 < 20190621120931-739145 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-21
  • stone: Sn 2
measured value uncertainty unit description
[SiO2] 49.17 %
[TiO2] 1.07 %
[Al2O3] 17.06 %
[Fe2O3T] 10.69 %
[MnO] 0.18 %
[MgO] 8.09 %
[CaO] 9.46 %
[Na2O] 3.21 %
[K2O] 0.76 %
[P2O5] 0.25 %
[LOI] 0.42 %
total 100.36 %
[Cr] 283.0 ppm
[Ni] 142.0 ppm
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name spots global-id