Sn 15 < 20190621120931-855948 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-21
  • stone: Sn 15
measured value uncertainty unit description
[SiO2] 50.18 %
[TiO2] 1.01 %
[Al2O3] 16.55 %
[Fe2O3T] 10.41 %
[MnO] 0.17 %
[MgO] 8.64 %
[CaO] 9.3 %
[Na2O] 3.12 %
[K2O] 0.75 %
[P2O5] 0.23 %
[LOI] -0.19 %
total 100.18 %
[Cr] 312.0 ppm
[Ni] 171.0 ppm
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