Sn 16 < 20190621120932-977511 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-21
  • stone: Sn 16
measured value uncertainty unit description
[SiO2] 49.74 %
[TiO2] 1.03 %
[Al2O3] 16.53 %
[Fe2O3T] 10.45 %
[MnO] 0.17 %
[MgO] 8.4 %
[CaO] 9.4 %
[Na2O] 3.17 %
[K2O] 0.72 %
[P2O5] 0.24 %
[LOI] 0.26 %
total 100.11 %
[Cr] 312.0 ppm
[Ni] 160.0 ppm
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name spots global-id