Sn 32 < 20190621120933-584493 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Kuritani
  • modified at 2019-06-21
  • stone: Sn 32
measured value uncertainty unit description
[SiO2] 49.95 %
[TiO2] 1.23 %
[Al2O3] 17.37 %
[Fe2O3T] 9.22 %
[MnO] 0.16 %
[MgO] 6.69 %
[CaO] 10.03 %
[Na2O] 3.35 %
[K2O] 0.98 %
[P2O5] 0.37 %
[LOI] 0.84 %
total 100.2 %
[Cr] 153.0 ppm
[Ni] 66.2 ppm
name global-id
name spots global-id