AON-04 < 20190829093040-153127 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Ivan
  • modified at 2019-08-29
  • stone: AON-04
measured value uncertainty unit description
[SiO2] 65.31 %
[TiO2] 0.54 %
[Al2O3] 17.36 %
[Fe2O3] 1.54 %
[FeO] 2.08 %
[MnO] 0.08 %
[MgO] 2.13 %
[CaO] 4.99 %
[Na2O] 4.17 %
[K2O] 1.53 %
[P2O5] 0.18 %
[LOI] 0.4 %
total 100.61 %
name global-id
name spots global-id