AON-10 < 20190829093041-933358 > pub
- technique: XRF procedures of Takei (2002)
- device: XRF PANalytical PW2400
- operator: Ivan
- modified at 2019-08-29
- stone: AON-10
| measured | value | uncertainty | unit | description | |
|---|---|---|---|---|---|
| [SiO2] | 62.1 | % | |||
| [TiO2] | 0.52 | % | |||
| [Al2O3] | 19.66 | % | |||
| [Fe2O3] | 2.78 | % | |||
| [FeO] | 1.1 | % | |||
| [MnO] | 0.1 | % | |||
| [MgO] | 2.09 | % | |||
| [CaO] | 4.52 | % | |||
| [Na2O] | 3.54 | % | |||
| [K2O] | 1.35 | % | |||
| [P2O5] | 0.26 | % | |||
| [LOI] | 2.1 | % | |||
| total | 100.51 | % | |||