AON-10 < 20190829093041-933358 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Ivan
  • modified at 2019-08-29
  • stone: AON-10
measured value uncertainty unit description
[SiO2] 62.1 %
[TiO2] 0.52 %
[Al2O3] 19.66 %
[Fe2O3] 2.78 %
[FeO] 1.1 %
[MnO] 0.1 %
[MgO] 2.09 %
[CaO] 4.52 %
[Na2O] 3.54 %
[K2O] 1.35 %
[P2O5] 0.26 %
[LOI] 2.1 %
total 100.51 %
name global-id
name spots global-id