AON-17 < 20190829093043-079077 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Ivan
  • modified at 2019-08-29
  • stone: AON-17
measured value uncertainty unit description
[SiO2] 62.4 %
[TiO2] 0.56 %
[Al2O3] 16.52 %
[Fe2O3] 3.74 %
[FeO] 0.23 %
[MnO] 0.07 %
[MgO] 3.21 %
[CaO] 4.8 %
[Na2O] 3.97 %
[K2O] 2.36 %
[P2O5] 0.21 %
[LOI] 2.1 %
total 100.48 %
name global-id
name spots global-id