AON-22 < 20190829093045-550391 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Ivan
  • modified at 2019-08-29
  • stone: AON-22
measured value uncertainty unit description
[SiO2] 58.72 %
[TiO2] 0.82 %
[Al2O3] 16.79 %
[Fe2O3] 5.44 %
[FeO] 0.02 %
[MnO] 0.11 %
[MgO] 3.32 %
[CaO] 6.39 %
[Na2O] 3.88 %
[K2O] 2.25 %
[P2O5] 0.34 %
[LOI] 1.3 %
total 99.65 %
name global-id
name spots global-id