MIS-06 < 20190905102719-009911 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Tai
  • modified at 2020-11-02
  • stone: MIS-6
measured value uncertainty unit description
[SiO2] 60.11 %
[TiO2] 0.59 %
[Al2O3] 18.89 %
[Fe2O3T] 5.42 %
[MnO] 0.09 %
[MgO] 3.08 %
[CaO] 6.34 %
[Na2O] 4.07 %
[K2O] 1.07 %
[P2O5] 0.15 %
[LOI] 0.52 %
total 100.3 %
[Cr] 19.8 µg/g
[Ni] 16.2 µg/g
name global-id
name spots global-id