US-01 < 20190905102724-142605 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Tai
  • modified at 2020-11-24
  • stone: ueshi20110417
measured value uncertainty unit description
[SiO2] 54.39 %
[TiO2] 1.32 %
[Al2O3] 18.41 %
[MnO] 0.14 %
[MgO] 4.69 %
[CaO] 8.16 %
[Na2O] 3.54 %
[K2O] 1.02 %
[P2O5] 0.5 %
total 100.61 %
[Fe2O3T] 2.48 %
name global-id
name spots global-id