MIS-02 < 20190905102725-395862 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Tai
  • modified at 2020-11-24
  • stone: MIS-2
measured value uncertainty unit description
[SiO2] 50.5 %
[TiO2] 2.03 %
[Al2O3] 17.28 %
[Fe2O3T] 11.59 %
[MnO] 0.16 %
[MgO] 5.85 %
[CaO] 8.17 %
[Na2O] 3.67 %
[K2O] 1.12 %
[P2O5] 0.5 %
[LOI] -0.25 %
total 100.62 %
[Cr] 93.3 µg/g
[Ni] 56.1 µg/g
name global-id
name spots global-id