TA 35 < 20120926162638-038-128 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • modified at 2019-09-13
measured value uncertainty unit description
[SiO2] 60.6 cg/g
[TiO2] 0.56 cg/g
[Al2O3] 15.8 cg/g
[Fe2O3] 5.75 cg/g
[MnO] 0.1 cg/g
[MgO] 2.7 cg/g
[CaO] 3.7 cg/g
[Na2O] 5.22 cg/g
[K2O] 3.24 cg/g
[P2O5] 0.27 cg/g
[LOI] 1.82 cg/g
total 99.7 cg/g
name global-id
name spots global-id