LN50 < 20200227111218-810790 > pub
  • technique: XRF procedures of Takei (2002)
  • device: XRF PANalytical PW2400
  • operator: Luisa
  • modified at 2020-02-27
  • stone: LN50
measured value uncertainty unit description
[SiO2] 42.4 %
[TiO2] 0.04 %
[Al2O3] 1.39 %
[FeOT] 7.47 %
[MnO] 0.12 %
[MgO] 41.7 %
[CaO] 0.98 %
[Na2O] 0.08 %
[K2O] 0.01 %
[P2O5] 0.01 %
[Cr2O3] 0.37 %
[NiO] 0.26 %
[LOI] 3.96 %
total 98.77 %
[Cr] 2530.0 ppm
[Ni] 2040.0 ppm
name global-id
name spots global-id